{"id":"arxiv:1307.8213","kind":"preprint","title":"Formal Analysis of Soft Errors using Theorem Proving","authors":["Naeem Abbasi","Osman Hasan","Sofiène Tahar"],"author_count":3,"year":2013,"published":"2013-07-31","venue":"EPTCS 122, 2013, pp. 75-84","cited_by":null,"doi":"10.4204/eptcs.122.7","arxiv_id":"1307.8213","nct_id":null,"source_url":"https://arxiv.org/abs/1307.8213","archive_url":"https://space-kitty.com/papers/arxiv:1307.8213","updated":"2013-07-31","pmid":null,"pmcid":null,"openalex_id":null,"pdf_url":"https://arxiv.org/pdf/1307.8213","abstract":"Modeling and analysis of soft errors in electronic circuits has traditionally been done using computer simulations. Computer simulations cannot guarantee correctness of analysis because they utilize approximate real number representations and pseudo random numbers in the analysis and thus are not well suited for analyzing safety-critical applications. In this paper, we present a higher-order logic theorem proving based method for modeling and analysis of soft errors in electronic circuits. Our developed infrastructure includes formalized continuous random variable pairs, their Cumulative Distribution Function (CDF) properties and independent standard uniform and Gaussian random variables. We illustrate the usefulness of our approach by modeling and analyzing soft errors in commonly used dynamic random access memory sense amplifier circuits.","abstract_license":"CC0-1.0 (arXiv descriptive metadata)","license":null,"is_open_access":false,"retracted":false,"peer_reviewed":false,"categories":["cs.LO"],"details":null,"provenance":"arxiv","attribution":"Abstract: arXiv descriptive metadata (CC0). Thank you to arXiv for use of its open access interoperability. This service was not reviewed or approved by, nor does it necessarily express or reflect the policies or opinions of, arXiv.","topics":[],"cited_in_dossiers":[]}