{"id":"arxiv:1806.04117","kind":"preprint","title":"In-field dependences of the critical current density J$_c$ in GdBa$_2$Cu$_3$O$_{7-d}$ coated conductors produced by Zr irradiation and post-annealing at low temperatures","authors":["N. Haberkorn","S. Suárez","Jae-Hun Lee","S. H. Moon","Hunju Lee"],"author_count":5,"year":2018,"published":"2018-06-11","venue":"Solid State Communications 289 (2019) 51-55","cited_by":null,"doi":"10.1016/j.ssc.2018.12.008","arxiv_id":"1806.04117","nct_id":null,"source_url":"https://arxiv.org/abs/1806.04117","archive_url":"https://space-kitty.com/papers/arxiv:1806.04117","updated":"2018-06-11","pmid":null,"pmcid":null,"openalex_id":null,"pdf_url":"https://arxiv.org/pdf/1806.04117","abstract":"We report the influence of 6 MeV Zr$^{4+}$ irradiation and post-irradiation annealing (200 °C) in the in-field dependences of the critical current densities J$_c$ of 1.3 $μ$m thick GdBa$_2$Cu$_3$O$_{7-d}$ coated conductors grown by co-evaporation. Samples were irradiated with 6 MeV Zr$^{4+}$ and fluences between 2.3x10$^{11}$ cm$^{-2}$ and 3x10$^{12}$ cm$^{-2}$. The correlation between the superconducting critical temperature T$_c$ and in-field dependences of critical current densities J$_c$ has been analyzed. In addition, random disorder introduced by irradiation was reduced by thermal annealed at 200 °C. The analysis of our experimental findings indicates that the optimal irradiation (reducing random disorder by annealing) results in the suppression of the self-field J$_c$ of $\\simeq$ 10 $\\%$ and in-field J$_c$ enhancements nearly doubled at about 5 T. A clear correlation between T$_c$, disorder and self-field J$_c$ is observed. Additional random disorder and nanoclusters suppress systematically T$_c$ and increase the flux creep relaxation at intermediate temperatures (reducing the characteristic glassy $μ$ value).","abstract_license":"CC0-1.0 (arXiv descriptive metadata)","license":null,"is_open_access":false,"retracted":false,"peer_reviewed":false,"categories":["cond-mat.supr-con"],"details":null,"provenance":"arxiv","attribution":"Abstract: arXiv descriptive metadata (CC0). Thank you to arXiv for use of its open access interoperability. This service was not reviewed or approved by, nor does it necessarily express or reflect the policies or opinions of, arXiv.","topics":[],"cited_in_dossiers":[]}