{"id":"doi:10.1038/s41586-018-0129-8","kind":"article","title":"Approaching the Schottky–Mott limit in van der Waals metal–semiconductor junctions","authors":["Yuan Liu","Jian Guo","Enbo Zhu","Lei Liao","Sung‐Joon Lee","Mengning Ding","Imran Shakir","Vincent Gambin","Yu Huang","Xiangfeng Duan"],"author_count":10,"year":2018,"published":"2018-05-01","venue":"Nature","cited_by":2139,"doi":"10.1038/s41586-018-0129-8","arxiv_id":null,"nct_id":null,"source_url":"https://doi.org/10.1038/s41586-018-0129-8","archive_url":"https://space-kitty.com/papers/doi:10.1038/s41586-018-0129-8","updated":null,"pmid":"29769729","pmcid":null,"openalex_id":"W2804762466","pdf_url":null,"abstract":null,"abstract_license":null,"license":null,"is_open_access":false,"retracted":false,"peer_reviewed":null,"categories":["2D Materials and Applications"],"details":null,"provenance":"openalex","attribution":"Metadata and citation counts: OpenAlex (CC0).","topics":[{"slug":"semiconductor-frontiers","name":"Semiconductor Device Frontiers","domain_slug":"materials"}],"cited_in_dossiers":[]}