{"id":"doi:10.1126/science.aat8126","kind":"article","title":"Controlled crack propagation for atomic precision handling of wafer-scale two-dimensional materials","authors":["Jaewoo Shim","Sang‐Hoon Bae","Wei Kong","Doyoon Lee","Kuan Qiao","Daniel Nezich","Yong Ju Park","Ruike Renee Zhao","Suresh Sundaram","Xin Li","Han‐Wool Yeon","Chanyeol Choi","Hyun S. Kum","Ruoyu Yue","Guanyu Zhou","Yunbo Ou","Kyusang Lee","Jagadeesh S. Moodera","Xuanhe Zhao","Jong‐Hyun Ahn","Christopher L. Hinkle","A. Ougazzaden","Jeehwan Kim"],"author_count":23,"year":2018,"published":"2018-10-11","venue":"Science","cited_by":333,"doi":"10.1126/science.aat8126","arxiv_id":null,"nct_id":null,"source_url":"https://doi.org/10.1126/science.aat8126","archive_url":"https://space-kitty.com/papers/doi:10.1126/science.aat8126","updated":null,"pmid":"30309906","pmcid":null,"openalex_id":"W2896953036","pdf_url":"https://www.science.org/cms/asset/bf9ab4e7-8616-4f34-8cb9-d5f1aa61c349/pap.pdf","abstract":null,"abstract_license":null,"license":null,"is_open_access":true,"retracted":false,"peer_reviewed":null,"categories":["2D Materials and Applications"],"details":null,"provenance":"openalex","attribution":"Metadata and citation counts: OpenAlex (CC0).","topics":[{"slug":"2d-materials","name":"2D Materials & Van der Waals Heterostructures","domain_slug":"materials"}],"cited_in_dossiers":[]}