Fast Native Three-Qubit Gates and Fault-Tolerant Quantum Error Correction with Trapped Rydberg Ions

Abstract

Trapped ions as one of the most promising quantum-information-processing platforms, yet conventional entangling gates mediated by collective motion remain slow and difficult to scale. Exciting trapped ions to high-lying electronic Rydberg states provides a promising route to overcome these limitations by enabling strong, long-range dipole-dipole interactions that support much faster multi-qubit operations. Here, we introduce the first scheme for implementing a native controlled-controlled-Z gate with microwave-dressed Rydberg ions by optimizing a single-pulse protocol that accounts for the finite Rydberg-state lifetime. The resulting gate outperforms standard decompositions into one- and two-qubit gates by achieving fidelities above 97% under realistic conditions, with execution times of about 2 microseconds at cryogenic temperatures. To explore the potential of trapped Rydberg ions for fault-tolerant quantum error correction, and to illustrate the utility of three-qubit Rydberg-ion gates in this context, we develop and analyze a proposal for fault-tolerant, measurement-free quantum error correction using the nine-qubit Bacon-Shor code. Our simulations confirm that quantum error correction can be performed in a fully fault-tolerant manner on a linear Rydberg-ion chain despite its limited qubit connectivity. These results establish native multiqubit Rydberg-ion gates as a valuable resource for fast, high-fidelity quantum computing and highlight their potential for fault-tolerant quantum error correction.

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