Controlled crack propagation for atomic precision handling of wafer-scale two-dimensional materials
Jaewoo Shim, Sang‐Hoon Bae, Wei Kong, Doyoon Lee, Kuan Qiao, Daniel Nezich, Yong Ju Park, Ruike Renee Zhao, Suresh Sundaram, Xin Li, Han‐Wool Yeon, Chanyeol Choi, Hyun S. Kum, Ruoyu Yue, Guanyu Zhou, Yunbo Ou, Kyusang Lee, Jagadeesh S. Moodera, Xuanhe Zhao, Jong‐Hyun Ahn, Christopher L. Hinkle, A. Ougazzaden, Jeehwan Kim
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Record
- Archive ID
- doi:10.1126/science.aat8126
- Published
- Oct 11, 2018
- Venue
- Science
- DOI
- 10.1126/science.aat8126
- PubMed
- 30309906
- Categories
- 2D Materials and Applications
- Provenance
- openalex