Size-dependent Transport Study of In0.53Ga0.47As Gate-all-around Nanowire MOSFETs: Impact of Quantum Confinement and Volume Inversion

Jiangjiang J. Gu, Heng Wu, Yiqun Liu, Adam T. Neal, Roy G. Gordon, Peide D. Ye

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Abstract

InGaAs gate-all-around nanowire MOSFETs with channel length down to 50nm have been experimentally demonstrated by top-down approach. The nanowire size-dependent transport properties have been systematically investigated. It is found that reducing nanowire dimension leads to higher on-current, transconductance and effective mobility due to stronger quantum confinement and the volume inversion effect. TCAD quantum mechanical simulation has been carried out to study the inversion charge distribution inside the nanowires. Volume inversion effect appears at a larger dimension for InGaAs nanowire MOSFET than its Si counterpart.

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Record

Archive ID
arxiv:1204.1665
Published
Apr 7, 2012
Venue
IEEE Electron Device Letters
DOI
10.1109/led.2012.2194690
arXiv
1204.1665
Categories
cond-mat.mes-hall, cond-mat.mtrl-sci
Provenance
arxiv

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