Approaching the Schottky–Mott limit in van der Waals metal–semiconductor junctions
Yuan Liu, Jian Guo, Enbo Zhu, Lei Liao, Sung‐Joon Lee, Mengning Ding, Imran Shakir, Vincent Gambin, Yu Huang, Xiangfeng Duan
The abstract is not reproduced here because its license does not permit redistribution. Read it at the original source.
Record
- Archive ID
- doi:10.1038/s41586-018-0129-8
- Published
- May 1, 2018
- Venue
- Nature
- DOI
- 10.1038/s41586-018-0129-8
- PubMed
- 29769729
- Categories
- 2D Materials and Applications
- Provenance
- openalex