Ultralow contact resistance between semimetal and monolayer semiconductors

Pin‐Chun Shen, Cong Su, Yuxuan Cosmi Lin, Ang‐Sheng Chou, Chao-Ching Cheng, Ji Hoon Park, Ming‐Hui Chiu, Ang‐Yu Lu, Hao‐Ling Tang, Mohammad Mahdi Tavakoli, Gregory Pitner, Xiang Ji, Zhengyang Cai, Nannan Mao, Jiangtao Wang, Vincent Tung, Ju Li, Jeffrey Bokor A, Alex K. Zettl, Chih‐I Wu, Tomás Palacios, Lain‐Jong Li, Jing Kong

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Record

Archive ID
doi:10.1038/s41586-021-03472-9
Published
May 12, 2021
Venue
Nature
DOI
10.1038/s41586-021-03472-9
PubMed
33981050
Categories
2D Materials and Applications
Provenance
openalex

Topics